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FT-I04 Femto-Indenter, a standalone MEMS-based nanoindenter for material property analysis.

FT-I04 Femto-Indenter

FT-NMT04 nanoindenter for in-situ SEM/FIB material analysis.

FT-NMT04 In-Situ SEM Nanoindenter

FemtoTools FT-MTA03 system highlighting its integrated microscope and precision sensing probe for microstructure analysis.

FT-MTA03 Micromechanical Testing And Assembly System

SEM image of Berkovich indentations revealing mechanical properties of a material via nanoindentation.
Nanoindentation / Mechanical Microscopy

Nanoindentation
Mechanical Microscopy
Correlative Mechanical Microscopy
Strain-Rate Control

 

High-temperature module for nanoindentation tests up to 400°C with inert gas atmosphere.
Temperature dependent testing

High-Temperature Testing

Scratch test topography providing quantitative data on material hardness and wear resistance.
Scratch Testing

Scratch Testing

Micro-pillar after compression in an SEM showing shear plane development.
In situ micromechanical testing

Micro-Pillar Compression
Micro-Cantilever Testing
Micro-Tensile Testing
Simultaneous Mechanical Testing with STEM/EBSD

MEMS testing apparatus measuring stiffness in micro-manufactured components for yield calculation.
MEMS testing

MEMS Mechanical Testing

Close-up of a spherical ruby indenter tip used for soft material characterization.
Soft-Material Testing

Soft-Material Testing

product overview

Product overview

FT-I04 Femto-Indenter, a standalone MEMS-based nanoindenter for material property analysis. FT-I04

Femto-Indenter

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FT-NMT04 nanoindenter for in-situ SEM/FIB material analysis. FT-NMT04

In-Situ SEM Nanoindenter

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FemtoTools FT-MTA03 system highlighting its integrated microscope and precision sensing probe for microstructure analysis. FT-MTA03

Micromechanical Testing And Assembly System

See Product
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