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Scratch Testing Module

Nano-Scratch, Nano-Tribology and SPM Imaging 

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FT-ST04 Scratch Testing Module

The FT-ST04 Scratch Testing Module consists of an exchangeable sample stage with an integrated piezo-scanner. This enables the in-plane movement of the sample while simultaneously applying a normal force. Combined with the FemtoTools 2-Axis Microforce Sensing Probe, this module enables nano-scratch, nano-tribology and nano-wear testing, as well as SPM imaging of surface roughness, high-aspect ratio features and residual scratches or indents

Specifications


Piezo-Scanner

250 µm
Travel range

 

0.4 NM
Noise floor

 


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