
The FT-ST04 Scratch Testing Module consists of an exchangeable sample stage with an integrated piezo-scanner. This enables the in-plane movement of the sample while simultaneously applying a normal force. Combined with the FemtoTools 2-Axis Microforce Sensing Probe, this module enables nano-scratch, nano-tribology and nano-wear testing, as well as SPM imaging of surface roughness, high-aspect ratio features and residual scratches or indents
Specifications
Piezo-Scanner
250 µm Travel range |
0.4 NM Noise floor |