FT-NMT04-XYZ can be upgraded with the FT-SEM-ROT * in-situ SEM rotation stage. This enables:
1. Rotary alignment of the sample to the indenter tip;
2. Testing of multiple samples in one session by using the rotation stage as a sample revolver;
3. Together with the included sensor and sample extender, the rotation stage can be used to enable correlative nanomechanical testing and STEM, TKD or EBSD imaging. Using electron transparent samples, TKD and STEM correlation requires the use of the FemtoTools FT-TT02 Nano-Tensile Testing Chip.
*Currently not available in the USA, Japan and Germany.
