The FT-S Two-Axis Microforce Sensing Probes are Micro-Electro Mechanical Systems (MEMS) based multi-axis microforce sensors capable of simultaneous measuring forces in the two in-plane directions. The primary application for these sensors is nano-scratch, nano-tribology and nano-wear testing.
The outstanding long-term stability and low signal drift guarantees significantly higher measurement accuracy than any other force sensing system in this force range. The accuracy of the FemtoTools SI-traceable calibration process is ensured by comparative measurements with the Swiss National Institute of Metrology (METAS).
The Two-Axis Microforce Sensing Probes are available with a wide variety of tip materials and geometries including diamond Berkovich, cube corner, flat punch, wedge, conical and more.
