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High-Temperature Microforce Sensing Probes

Isotherm Nanomechanical Testing up to 800°C

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USB-key sized MEMS-based microforce sensing probe for precise force measurement.
Close-up image of microelectromechanical sensor for nanoscale force measurement at elevate temperature.
Close-up of a Berkovich indenter tip for hardness testing.

The  FT-S High-Temperature Microforce Sensing Probes are Micro-Electro Mechanical Systems (MEMS) based microforce sensors capable of measuring forces from 200mN to 2 µN. Furthermore, with the monolithically integrated tip heater, the temperature of the nanoindenter tip can be accurately matched to the temperature of the sample, enabling isothermal testing conditions.

The outstanding long-term stability and low signal drift guarantees significantly higher measurement accuracy than any other force sensing system in this force range. The accuracy of the FemtoTools SI-traceable calibration process is ensured by comparative measurements with the Swiss National Institute of Metrology (METAS).

The High-Temperature Microforce Sensing Probes are available with a variety of tip materials such as diamond or tungsten carbide with various geometries including Berkovich, cube corner, flat punch, wedge, conical and more.

Specifications


Force Sensing

+/- 200 mN
Force range

 

2 µN
Force resolution (noise at 10 Hz)

 


Compatible Products

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FT-I04 Femto-Indenter, a standalone MEMS-based nanoindenter for material property analysis. FT-104

Femto-Indenter

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FT-NMT04 Nanomechanical Testing System for precise in-situ SEM/FIB material analysis. FT-NMT04

In-Situ Nanoindenter

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Side view of FemtoTools FT-MTA03 system highlighting its integrated microscope and precision sensing probe for microstructure analysis. FT-MTA03

Mechanical Testing and Assembly System

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