NanoindentationCSM Nanoindentation H-hCSM Nanoindentation E-hNanoindentation P-hRelative Error of HardnessRelative Error of Modulus
NanoindentationCSM Nanoindentation CSM Nanoindentation Nanoindentation Force-Displacement CurveRelative Error of HardnessRelative Error of Modulus

Nanoindentation

The FT-IO4 Femto-Indenter and the FT-NMT04 in-situ SEM Nanoindenter enable the measurement of hardness, modulus, creep, relaxation and fracture toughness for a wide range of materials, from bulk metals and ceramics to hydrogels, thin films or hard coatings. This is done by instrumented indentation of a sharp tip with a known or calibrated shape into a material, while recording the force required to penetrate to a given depth.
The Femto-Indenter features standard indentation (ISO 14577) and automated procedures for quick tip shape calibration. The integrated continuous stiffness measurement (CSM) mode enables the measurement of mechanical properties as a function of the indentation depth. It benefits from a depth sensing noise floor of 50 pm. As an example for the outstanding data quality and stability, the results from 100 indents into quartz glass are shown on the right. (The full data set without data selection is shown.)
Featuring intrinsic position control, the Femto-Indenter enables the quantification of fast stress drops, transients and high speed events with a quality that is not possible with force-controlled systems.