Modular in-situ SEM NanoindenterVersatile in-situ SEM NanoindenterMEMS-Based NanoindenterModular Testing Software SuiteinFIB NanoindentationinSEM Nanoindentation
Modular in-situ SEM NanoindenterVersatile in-situ SEM NanoindenterMEMS-Based NanoindenterModular Testing Software SuiteinFIB NanoindentationinSEM Nanoindentation

Features

  • Nanoindentation, compression- , tensile- , fracture- and fatigue testing
  • Patented MEMS-based sensing technology enables highest resolution and repeatability of force from 0.5 nN to 200 mN and displacement from 0.05 nm to 21 mm
  • Ability to conduct continuous stiffness measurement (CSM) or fatigue testing up to 500 Hz without the need for complex, dynamic calibrations
  • True displacement-controlled testing, enabling the quantification of fast stress-drops (optional force-feedback based force-controlled measurements are possible as well)
  • 3, 4, or 5-Axis (x, y, z, rotation, tilt), closed-loop sensor to sample alignment using position encoders on all axes
  • Elevated temperature testing up to 400°C
  • Ability to sequentially orient the sample towards the nanoindenter tip, the electron-beam and the EBSD detector to evaluate hardness in specific grains and locations (only with the 5-axis configuration)
  • Simple determination of the indenter area function and frame compliance
  • Powerful data analysis tool to evaluate measurement results and apply fits or functions to calculate material properties
  • SEM sample stage mount enables fast installation and removal of the system inside the SEM chamber
  • Compact, modular design enables the integration into almost any SEM
  • Customizable measurement procedures and principles