Rotation Stage4-Axis in-situ SEM NanoindenterIn-situ SEM Nanoindeter for Correlative In-Situ Nanomechanical Testing with STEM/EBSD
Rotation Stage4-Axis in-situ SEM NanoindenterIn-situ SEM Nanoindeter for Correlative In-Situ Nanomechanical Testing with STEM/EBSD

FT-SEM-ROT Rotation Stage

FT-NMT04-XYZ can be upgraded with a rotation stage. This enables:

  1. Rotary alignment of the sample to the indenter tip
  2. Testing of multiple samples in one session by using the rotation stage as a sample revolver
  3. Together with the included sensor and sample extender, the rotation stage can be used to enable correlative nanomechanical testing and STEM, TKD or EBSD imaging. Using electron transparent samples, TKD and STEM correlation requires the use of the FemtoTools FT-TT02 Nano-Tensile Testing Chip.

                                                 currently not available in the USA, Japan and Germany

Compatible Measurement Systems

  • FT-NMT04 Nanomechanical Testing System