FT-SEM-ROT Rotation Stage
FT-NMT04-XYZ can be upgraded with a rotation stage. This enables:
- Rotary alignment of the sample to the indenter tip
- Testing of multiple samples in one session by using the rotation stage as a sample revolver
- Together with the included sensor and sample extender, the rotation stage can be used to enable correlative nanomechanical testing and STEM, TKD or EBSD imaging. Using electron transparent samples, TKD and STEM correlation requires the use of the FemtoTools FT-TT02 Nano-Tensile Testing Chip.
FT-SEM-ROT/TILT Rotation & Tilt Stage
With only a few simple steps, the FT-NMT04-XYZ can be upgraded with a rotation/tilt stage.
This enables the sequential alignment of the sample towards the nanoindenter, the SEM’s pole piece and the EBSD detector.
With this functionality, the exact shape of nanoindentations as well as the strain fields around the indent can be evaluated.