FT-ST04 Scratch Testing Module Combined scratch testing and SPM imagingScratch testing with progressive loadPre- and post-scratch topography scanning
FT-ST04 Scratch Testing Module Combined scratch testing and SPM imagingProgressive load scratch testing3-Pass Scratch Testing and Scanning

FT-ST04 Scratch Testing Module

The Scratch Testing Module (coming soon) consists of an exchangeable sample stage with an integrated piezoscanner. This enables the in-plane movement of the sample while simultaneously applying a normal force. Combined with the FemtoTools 2-Axis Microforce Sensing Probe, this module enables nanoindentation, nano-scratch and nano-wear testing, as well as SPM imaging of surface roughness, high-aspect ratio features and residual scratches or indents.

Specifications & Features

Sensor Force Range Resolution
@10Hz
FT-S20'000 ±20'000µN 0.05 µN
FT-S200'000 ±200'000µN 0.5 µN
FT-S20'000-2Axis ±20'000µN / ±20'000µN 0.1 µN / 0.1 µN

Typical tip options

Application Geometry Material
Nanoscratch testing Cube corner Diamond
Nanowear testing Cube corner / conical Diamond
Nanoindentation Berkovich / cube corner Diamond